High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM)

New York, NY / Springer (2012) [Contribution to a book]

Modeling Nanoscale Imaging in Electron Microscopy / ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev
Page(s): 127-145

Authors

Selected Authors

Binev, Peter
Blanco-Silva, Francisco
Blom, Douglas
Dahmen, Wolfgang
Lamby, Philipp

Other Authors

Sharpley, Robert C.
Vogt, Thomas

Identifier

  • REPORT NUMBER: RWTH-CONV-110679