Compressed Sensing and Electron Microscopy

New York, NY / Springer (2012) [Contribution to a book]

Modeling Nanoscale Imaging in Electron Microscopy / ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev
Page(s): 73-126

Authors

Selected Authors

Binev, Peter
Dahmen, Wolfgang
DeVore, Ronald A.
Lamby, Philipp
Savu, Daniel

Other Authors

Sharpley, Robert C.

Identifier

  • REPORT NUMBER: RWTH-CONV-110683