Poisson noise removal from high-resolution STEM images based on periodic block matching

Cham / Springer International Publishing AG (2015) [Journal Article]

Advanced Structural and Chemical Imaging
Volume: 1
Issue: 1
Page(s): 3

Authors

Selected Authors

Mevenkamp, Niklas
Binev, Peter
Dahmen, Wolfgang
Voyles, Paul M.
Yankovich, Andrew B.

Other Authors

Berkels, Benjamin

Identifier