High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM)

Binev, Peter; Blanco-Silva, Francisco; Blom, Douglas; Dahmen, Wolfgang; Lamby, Philipp; Sharpley, Robert C.; Vogt, Thomas

New York, NY / Springer (2012) [Buchbeitrag]

Modeling Nanoscale Imaging in Electron Microscopy / ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev
Seite(n): 127-145

Identifikationsnummern

  • REPORT NUMBER: RWTH-CONV-110679