High Precision STEM Imaging by Non-Rigid Alignment and Averaging of a Series of Short Exposures

New York, NY / Cambridge Univ. Press (2012) [Abstract, Contribution to a conference proceedings, Journal Article]

Microscopy and microanalysis
Volume: 18
Issue: S1
Page(s): 300-301


Selected Authors

Berkels, Benjamin
Yankovich, Andrew B.
Shi, F.
Voyles, Paul M.
Dahmen, Wolfgang

Other Authors

Sharpley, Robert C.
Binev, Peter