Measuring Surface Atom Bond Length Contraction in Au and Pt Nanoparticles Using High-Precision STEM Imaging
Yankovich, Andrew B.; Berkels, Benjamin; Dahmen, Wolfgang; Sharpley, Robert C.; Binev, Peter; Voyles, Paul M.
New York, NY / Cambridge Univ. Press (2013) [Abstract, Contribution to a conference proceedings, Journal Article]
Microscopy and microanalysis
Volume: 19
Issue: Suppl. 2
Page(s): 1688-1689
Identifier
- DOI: 10.1017/S143192761301043X
- REPORT NUMBER: RWTH-CONV-005804