Compressed Sensing and Electron Microscopy

Binev, Peter; Dahmen, Wolfgang; DeVore, Ronald A.; Lamby, Philipp; Savu, Daniel; Sharpley, Robert C.

New York, NY : Springer (2012)
Buchbeitrag

In: Modeling Nanoscale Imaging in Electron Microscopy / ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev
Seite(n)/Artikel-Nr.: 73-126