High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose

Yankovich, Andrew B.; Berkels, Benjamin; Dahmen, Wolfgang; Binev, Peter; Voyles, Paul M. (Corresponding author)

s.l.] (2015)
Fachzeitschriftenartikel

In: Advanced Structural and Chemical Imaging
Band: 1
Heft: 1
Seite(n)/Artikel-Nr.: 2