High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose

Yankovich, Andrew B.; Berkels, Benjamin; Dahmen, Wolfgang; Binev, Peter; Voyles, Paul M. (Corresponding author)

s.l.] (2015)
Journal Article

In: Advanced Structural and Chemical Imaging
Volume: 1
Issue: 1
Page(s)/Article-Nr.: 2