Poisson noise removal from high-resolution STEM images based on periodic block matching

Mevenkamp, Niklas (Corresponding author); Binev, Peter; Dahmen, Wolfgang; Voyles, Paul M.; Yankovich, Andrew B.; Berkels, Benjamin

Cham : Springer International Publishing AG (2015)
Fachzeitschriftenartikel

In: Advanced Structural and Chemical Imaging
Band: 1
Heft: 1
Seite(n)/Artikel-Nr.: 3