Confidence regions in step-stress experiments with multiple samples under repeated type-II censoring
Bedbur, Stefan (Corresponding author); Kamps, Udo
Amsterdam : Elsevier Science (2018, 2019)
Fachzeitschriftenartikel
In: Statistics & probability letters
Band: 146
Seite(n)/Artikel-Nr.: 181-186
Identifikationsnummern
- DOI: 10.1016/j.spl.2018.11.020
- RWTH PUBLICATIONS: RWTH-2019-01979