Multilevel double loop Monte Carlo and stochastic collocation methods with importance sampling for Bayesian optimal experimental design

Beck, Joakim; Mansour Dia, Ben; Espath, Luis (Corresponding author); Tempone, Raul

Chichester [u.a.] : Wiley (2020)
Fachzeitschriftenartikel

In: International journal for numerical methods in engineering
Band: 121
Heft: 15
Seite(n)/Artikel-Nr.: 3482-3503

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