A deterministic model of electron transport for electron probe microanalysis

Bünger, Jonas (Corresponding author); Richter, Silvia; Torrilhon, Manuel

London [u.a.] : Institute of Physics (2018)
Contribution to a book, Contribution to a conference proceedings

In: EMAS 2017 Workshop - 15th European Workshop on Modern Developments and Applications in Microbeam Analysis & IUMAS-7 Meeting - 7th Meeting of the International union of Microbeam Analysis Societies : 7-11 May 2017, Konstanz, Germany
Page(s)/Article-Nr.: 012004 -


  • Central Facility for Electron Microscopy [025000]
  • Center for Computational Engineering Science [080002]
  • Department of Mathematics [110000]
  • Chair of Applied and Computational Mathematics [115010]