Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series
Zhang, Chenyu; Feng, Jie; Yankovich, Andrew B.; Kvit, Alexander; Berkels, Benjamin (Corresponding author); Voyles, Paul M. (Corresponding author)
New York, NY : Cambridge University Press (2020, 2021)
Journal Article
In: Microscopy and microanalysis
Volume: 27
Issue: 1
Page(s)/Article-Nr.: 90-98
Institutions
- Aachen Institute for Advanced Study in Computational Engineering Science [080003]
- Department of Mathematics [110000]
- Chair of Mathematics and Institute for Geometry and Applied Mathematics [111410]
- Junior Professorship of Mathematical Image and Signal Processing [112430]
Identifier
- DOI: 10.1017/S1431927620024708
- RWTH PUBLICATIONS: RWTH-2021-03291