High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM)

Binev, Peter (Author); Blanco-Silva, Francisco (Author); Blom, Douglas (Author); Dahmen, Wolfgang (Author); Lamby, Philipp (Author); Sharpley, Robert C. (Author); Vogt, Thomas (Author)

New York, NY / Springer (2012) [Buchbeitrag]

Modeling Nanoscale Imaging in Electron Microscopy / ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev
Seite(n): 127-145

Identifikationsnummern

  • REPORT NUMBER: RWTH-CONV-110679