Compressed Sensing and Electron Microscopy

Binev, Peter; Dahmen, Wolfgang; DeVore, Ronald A.; Lamby, Philipp; Savu, Daniel; Sharpley, Robert C.

New York, NY / Springer (2012) [Buchbeitrag]

Modeling Nanoscale Imaging in Electron Microscopy / ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev
Seite(n): 73-126

Identifikationsnummern

  • REPORT NUMBER: RWTH-CONV-110683