Compressed Sensing and Electron Microscopy

Binev, Peter (Author); Dahmen, Wolfgang (Author); DeVore, Ronald A. (Author); Lamby, Philipp (Author); Savu, Daniel (Author); Sharpley, Robert C. (Author)

New York, NY / Springer (2012) [Buchbeitrag]

Modeling Nanoscale Imaging in Electron Microscopy / ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev
Seite(n): 73-126

Identifikationsnummern

  • REPORT NUMBER: RWTH-CONV-110683