High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose

Yankovich, Andrew B.; Berkels, Benjamin; Dahmen, Wolfgang; Binev, Peter; Voyles, Paul M. (Corresponding author)

s.l.] (2015) [Fachzeitschriftenartikel]

Advanced Structural and Chemical Imaging
Band: 1
Ausgabe: 1
Seite(n): 2

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