Poisson noise removal from high-resolution STEM images based on periodic block matching

Mevenkamp, Niklas (Corresponding author); Binev, Peter; Dahmen, Wolfgang; Voyles, Paul M.; Yankovich, Andrew B.; Berkels, Benjamin

Cham / Springer International Publishing AG (2015) [Fachzeitschriftenartikel]

Advanced Structural and Chemical Imaging
Band: 1
Ausgabe: 1
Seite(n): 3

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