Importance Sampling for Determining SRAM Yield and Optimization with Statistical Constraint

ter Maten, E. J. W. (Corresponding author); Wittich, Olaf; Di Bucchianico, A.; Doorn, T. S.; Beelen, T. G. J.

Berlin, Heidelberg / Springer Berlin Heidelberg (2011, 2012) [Buchbeitrag, Beitrag zu einem Tagungsband]

Scientific Computing in Electrical Engineering SCEE 2010 / edited by Bastiaan Michielsen, Jean-René Poirier
Seite(n): 39-47

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