Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series

Zhang, Chenyu; Feng, Jie; Yankovich, Andrew B.; Kvit, Alexander; Berkels, Benjamin (Corresponding author); Voyles, Paul M. (Corresponding author)

New York, NY : Cambridge University Press (2020, 2021)
Fachzeitschriftenartikel

In: Microscopy and microanalysis
Band: 27
Heft: 1
Seite(n)/Artikel-Nr.: 90-98