Glaz, Joseph ; Naus, Joseph ; Wallenstein, Sylvan: Scan statistics / Joseph Glaz ; Joseph Naus ; Sylvan Wallenstein. - New York ; Berlin ; Heidelberg ; Barcelona ; Hong Kong ; London ; Milan ; Paris ; Singapore ; Tokyo, 2001

Cramer, Erhard

Berlin ; Heidelberg / Springer (2001) [Journal Article]

Metrika
Volume: 57
Page(s): 313-314