Glaz, Joseph ; Naus, Joseph ; Wallenstein, Sylvan: Scan statistics / Joseph Glaz ; Joseph Naus ; Sylvan Wallenstein. - New York ; Berlin ; Heidelberg ; Barcelona ; Hong Kong ; London ; Milan ; Paris ; Singapore ; Tokyo, 2001
Cramer, Erhard
Berlin ; Heidelberg : Springer (2001)
Journal Article
In: Metrika
Volume: 57
Page(s)/Article-Nr.: 313-314
Identifier
- RWTH PUBLICATIONS: RWTH-CONV-027994