Measuring Surface Atom Bond Length Contraction in Au and Pt Nanoparticles Using High-Precision STEM Imaging

New York, NY / Cambridge Univ. Press (2013) [Abstract, Contribution to a conference proceedings, Journal Article]

Microscopy and microanalysis
Volume: 19
Issue: Suppl. 2
Page(s): 1688-1689


Selected Authors

Yankovich, Andrew B.
Berkels, Benjamin
Dahmen, Wolfgang
Sharpley, Robert C.
Binev, Peter

Other Authors

Voyles, Paul M.