Poisson noise removal from high-resolution STEM images based on periodic block matching
Mevenkamp, Niklas (Corresponding author); Binev, Peter; Dahmen, Wolfgang; Voyles, Paul M.; Yankovich, Andrew B.; Berkels, Benjamin
Cham : Springer International Publishing AG (2015)
Journal Article
In: Advanced Structural and Chemical Imaging
Volume: 1
Issue: 1
Page(s)/Article-Nr.: 3
Institutions
- Aachen Institute for Advanced Study in Computational Engineering Science [080003]
- Department of Mathematics [110000]
- Chair of Mathematics and Institute for Geometry and Applied Mathematics [111410]
- Junior Professorship of Mathematical Image and Signal Processing [112430]
Identifier
- DOI: 10.1186/s40679-015-0004-8
- DOI: 10.18154/RWTH-2015-05477
- RWTH PUBLICATIONS: RWTH-2015-05477