Poisson noise removal from high-resolution STEM images based on periodic block matching

Mevenkamp, Niklas (Corresponding author); Binev, Peter; Dahmen, Wolfgang; Voyles, Paul M.; Yankovich, Andrew B.; Berkels, Benjamin

Cham : Springer International Publishing AG (2015)
Journal Article

In: Advanced Structural and Chemical Imaging
Volume: 1
Issue: 1
Page(s)/Article-Nr.: 3