Poisson noise removal from high-resolution STEM images based on periodic block matching

Mevenkamp, Niklas (Corresponding author); Binev, Peter; Dahmen, Wolfgang; Voyles, Paul M.; Yankovich, Andrew B.; Berkels, Benjamin

Cham / Springer International Publishing AG (2015) [Journal Article]

Advanced Structural and Chemical Imaging
Volume: 1
Issue: 1
Page(s): 3

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