Non-local averaging in EM: decreasing the required electron dose in crystal image reconstruction without losing spatial resolution

Mevenkamp, Niklas (Corresponding author); Berkels, Benjamin

Weinheim, Germany : Wiley-VCH (2016)
Abstract, Contribution to a book, Contribution to a conference proceedings

In: Proceedings of the 16th European Microscopy Congress : Lyon, France, 28th August 28 - 2nd September 2016 / [organized by the French Society of Microscopy under the auspices of the European Microscopy Society and the International Federation of Microscopy Societies]
Page(s)/Article-Nr.: 529-530

Institutions

• Aachen Institute for Advanced Study in Computational Engineering Science [080003]
• Department of Mathematics [110000]
• Junior Professorship of Mathematical Image and Signal Processing [112430]