Denoising Electron-energy Loss Data Using Non-local Means Filters

New York, NY / Cambridge University Press (2017) [Contribution to a conference proceedings, Journal Article]

Microscopy and Microanalysis
Volume: 23
Issue: S1
Page(s): 106-107

Authors

Authors

Mevenkamp, Niklas
Berkels, Benjamin
Duchamp, Martial

Identifier