Denoising Electron-energy Loss Data Using Non-local Means Filters

Mevenkamp, Niklas; Berkels, Benjamin; Duchamp, Martial

New York, NY : Cambridge University Press (2017)
Contribution to a conference proceedings, Journal Article

In: Microscopy and Microanalysis
Volume: 23
Issue: S1
Page(s)/Article-Nr.: 106-107

Identifier