Denoising Electron-energy Loss Data Using Non-local Means Filters
Mevenkamp, Niklas; Berkels, Benjamin; Duchamp, Martial
New York, NY : Cambridge University Press (2017)
Contribution to a conference proceedings, Journal Article
In: Microscopy and Microanalysis
Volume: 23
Issue: S1
Page(s)/Article-Nr.: 106-107
Identifier
- DOI: 10.1017/S1431927617001210
- RWTH PUBLICATIONS: RWTH-2018-222508