Denoising Electron-energy Loss Data Using Non-local Means Filters
New York, NY / Cambridge University Press (2017) [Contribution to a conference proceedings, Journal Article]
Microscopy and Microanalysis
Volume: 23
Issue: S1
Page(s): 106-107
Authors
Authors
Mevenkamp, Niklas
Berkels, Benjamin
Duchamp, Martial
Identifier
- DOI: 10.1017/S1431927617001210
- REPORT NUMBER: RWTH-2018-222508