Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision

Wang, Yi; Jones, Lewys; Berkels, Benjamin; Sigle, Wilfried; van Aken, Peter A.

New York, NY / Cambridge University Press (2017) [Contribution to a conference proceedings, Journal Article]

Microscopy and microanalysis
Volume: 23
Issue: Suppl 1
Page(s): 1612-1613

Identifier