Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision
New York, NY / Cambridge University Press (2017) [Contribution to a conference proceedings, Journal Article]
Microscopy and microanalysis
Volume: 23
Issue: Suppl 1
Page(s): 1612-1613
Authors
Authors
Wang, Yi
Jones, Lewys
Berkels, Benjamin
Sigle, Wilfried
van Aken, Peter A.
Identifier
- DOI: 10.1017/S1431927617008728
- REPORT NUMBER: RWTH-2018-222517