Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision

Wang, Yi; Jones, Lewys; Berkels, Benjamin; Sigle, Wilfried; van Aken, Peter A.

New York, NY : Cambridge University Press (2017)
Contribution to a conference proceedings, Journal Article

In: Microscopy and microanalysis
Volume: 23
Issue: Suppl 1
Page(s)/Article-Nr.: 1612-1613

Identifier