Importance Sampling for Determining SRAM Yield and Optimization with Statistical Constraint

Berlin, Heidelberg / Springer Berlin Heidelberg (2011, 2012) [Contribution to a book, Contribution to a conference proceedings]

Scientific Computing in Electrical Engineering SCEE 2010 / edited by Bastiaan Michielsen, Jean-René Poirier
Page(s): 39-47

Authors

Selected Authors

ter Maten, E. J. W.
Wittich, Olaf
Di Bucchianico, A.
Doorn, T. S.
Beelen, T. G. J.

Identifier