Multilevel double loop Monte Carlo and stochastic collocation methods with importance sampling for Bayesian optimal experimental design
Beck, Joakim; Mansour Dia, Ben; Espath, Luis (Corresponding author); Tempone, Raul
Chichester [u.a.] : Wiley (2020)
Journal Article
In: International journal for numerical methods in engineering
Volume: 121
Issue: 15
Page(s)/Article-Nr.: 3482-3503
Identifier
- DOI: 10.1002/nme.6367
- RWTH PUBLICATIONS: RWTH-2020-06031