Multilevel double loop Monte Carlo and stochastic collocation methods with importance sampling for Bayesian optimal experimental design
Chichester [u.a.] / Wiley (2020) [Journal Article]
International journal for numerical methods in engineering
Page(s): 1-22
Authors
Authors
Beck, Joakim
Mansour Dia, Ben
Espath, Luis
Tempone, Raul
Identifier
- DOI: 10.1002/nme.6367
- REPORT NUMBER: RWTH-2020-06031