Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images

Zhang, Chenyu; Berkels, Benjamin; Wirth, Benedikt; Voyles, Paul M.

New York, NY : Cambridge University Press (2017)
Contribution to a conference proceedings, Journal Article

In: Microscopy and microanalysis
Volume: 23
Issue: S1
Page(s)/Article-Nr.: 164-165

Institutions

• Aachen Institute for Advanced Study in Computational Engineering Science [080003]
• Department of Mathematics [110000]
• Chair of Mathematics and Institute for Geometry and Applied Mathematics [111410]
• Junior Professorship of Mathematical Image and Signal Processing [112430]