Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images
Zhang, Chenyu; Berkels, Benjamin; Wirth, Benedikt; Voyles, Paul M.
New York, NY : Cambridge University Press (2017)
Contribution to a conference proceedings, Journal Article
In: Microscopy and microanalysis
Volume: 23
Issue: S1
Page(s)/Article-Nr.: 164-165
Institutions
- Aachen Institute for Advanced Study in Computational Engineering Science [080003]
- Department of Mathematics [110000]
- Chair of Mathematics and Institute for Geometry and Applied Mathematics [111410]
- Junior Professorship of Mathematical Image and Signal Processing [112430]
Identifier
- DOI: 10.1017/S1431927617001507
- RWTH PUBLICATIONS: RWTH-2021-00899