Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission Electron Microscopy

Pinetz, Thomas (Corresponding author); Kobler, Erich; Doberstein, Christian; Berkels, Benjamin; Effland, Alexander

Cham : Springer International Publishing (2021)
Contribution to a book, Contribution to a conference proceedings

In: Scale Space and Variational Methods in Computer Vision : 8th International Conference, SSVM 2021, Virtual Event, May 16-20, 2021, Proceedings / edited by Abderrahim Elmoataz, Jalal Fadili, Yvain Quéau, Julien Rabin, Loïc Simon
Page(s)/Article-Nr.: 491-502