A Model for Characteristic X-Ray Emission in Electron Probe Microanalysis Based on the (Filtered) Spherical Harmonic (PN) Method for Electron Transport

Bünger, Jonas (Corresponding author); Richter, Silvia; Torrilhon, Manuel

New York, NY : Cambridge University Press (2022)
Journal Article

In: Microscopy and microanalysis
Volume: 28
Issue: 2
Page(s)/Article-Nr.: 454-468

Institutions

• Central Facility for Electron Microscopy [025000]
• Department of Mathematics [110000]
• Chair of Applied and Computational Mathematics [115010]